Automated analysis device, and abnormality detecting method | Patent Publication Number 20220221477
US 20220221477 A1Publication DateJul 14, 2022
Original AssigneeHitachi Ltd.
Current AssigneeHitachi Hightech Instruments Co. Ltd
Inventor/ApplicantsYuichiro Ota
Takaaki HAGIWARA
Takaaki Hagiwara
Hirobumi Shiohata
Yuichiro OTA
Hirobumi SHIOHATA
Takaaki HAGIWARA
Takaaki Hagiwara
Hirobumi Shiohata
Yuichiro OTA
Hirobumi SHIOHATA
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