Automated analysis device, and abnormality detecting method | Patent Publication Number 20220221477

US 20220221477 A1
Patent NumberUS 12163972 B2
Application Number17596014
Filled DateMar 3, 2020
Priority DateMar 3, 2020
Publication DateJul 14, 2022
Original AssigneeHitachi Ltd.
Inventor/ApplicantsYuichiro Ota
Takaaki HAGIWARA
Takaaki Hagiwara
Hirobumi Shiohata
Yuichiro OTA
Hirobumi SHIOHATA
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