Automated analysis device, and abnormality detecting method | Patent Number 12163972

US 12163972 B2
Application Number17596014
Publication NumberUS 20220221477 A1
Pendency4 years, 9 months, 13 days
Filled DateMar 3, 2020
Priority DateMar 3, 2020
Publication DateJul 14, 2022
Expiration DateMar 2, 2040
Inventor/ApplicantsHirobumi SHIOHATA
Takaaki Hagiwara
Yuichiro Ota
Yuichiro OTA
Hirobumi Shiohata
Takaaki HAGIWARA
Examines-
Art Unit0
Technology Center0
Assignments
Hitachi Hightech Instruments Co. Ltd
Current
Hitachi Hightech Instruments Co. LtdHitachi Ltd.
Original
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