Automated analysis device, and abnormality detecting method | Patent Application Number 17596014

17596014
Not Appealed
Patent NumberUS 12163972 B2
Publication NumberUS 20220221477 A1
Filled DateMar 3, 2020
Priority DateMar 3, 2020
Inventor/ApplicantsHirobumi SHIOHATA
Takaaki Hagiwara
Yuichiro Ota
Yuichiro OTA
Hirobumi Shiohata
Takaaki HAGIWARA
Examines-
Art Unit0
Technology Center0
Assignments
Hitachi Hightech Instruments Co. Ltd
Current
Hitachi Hightech Instruments Co. LtdHitachi Ltd.
Original
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