Method and apparatus for measuring measurement of two-dimensional pattern corresponding to three-dimensional virtual clothing | Patent Publication Number 20210217214

US 20210217214 A1
Patent NumberUS 11222448 B2
Application Number17027426
Filled DateSep 21, 2020
Priority DateSep 21, 2020
Publication DateJul 15, 2021
Original AssigneeClo Virtual Fashion Inc.
Current AssigneeClo Virtual Fashion Inc.
Inventor/ApplicantsHohyun Lee
Hohyun LEE
Yeji KIM
Yeji Kim
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