Method and apparatus for measuring measurement of two-dimensional pattern corresponding to three-dimensional virtual clothing | Patent Number 11222448
US 11222448 B2Filled DateSep 21, 2020
Priority DateSep 21, 2020
Publication DateJul 15, 2021
Expiration DateSep 20, 2040
Inventor/ApplicantsHohyun Lee
Hohyun LEE
Yeji KIM
Yeji Kim
Hohyun LEE
Yeji KIM
Yeji Kim
ExaminesHOANG, PHI
Art Unit2613
Technology Center2600
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