Method and apparatus for measuring measurement of two-dimensional pattern corresponding to three-dimensional virtual clothing | Patent Number 11222448

US 11222448 B2
Application Number17027426
Publication NumberUS 20210217214 A1
Pendency1 year, 3 months, 22 days
Filled DateSep 21, 2020
Priority DateSep 21, 2020
Publication DateJul 15, 2021
Expiration DateSep 20, 2040
Inventor/ApplicantsHohyun Lee
Hohyun LEE
Yeji KIM
Yeji Kim
ExaminesHOANG, PHI
Art Unit2613
Technology Center2600
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