Method and apparatus for measuring measurement of two-dimensional pattern corresponding to three-dimensional virtual clothing | Patent Application Number 17027426

17027426
Not Appealed
Patent NumberUS 11222448 B2
Publication NumberUS 20210217214 A1
Filled DateSep 21, 2020
Priority DateSep 21, 2020
Inventor/ApplicantsHohyun Lee
Hohyun LEE
Yeji KIM
Yeji Kim
ExaminesHOANG, PHI
Art Unit2613
Technology Center2600
Assignments
Clo Virtual Fashion Inc.
Current
Clo Virtual Fashion Inc.
Original
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