Breaking up long-channel field effect transistor into smaller segments for reliability modeling | Patent Publication Number 20140096094
US 20140096094 A1Patent NumberUS 08875070 B2
Application Number13837348
Filled DateMar 15, 2013
Priority DateOct 3, 2012
Publication DateApr 3, 2014
Original AssigneeBroadcom
Current AssigneeLsi Broadcom
Agere Systems Broadcom
Agere Systems Broadcom
Inventor/ApplicantsDavid Averill Bell
Bonnie E. Weir
Bonnie E. Weir
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