Breaking up long-channel field effect transistor into smaller segments for reliability modeling | Patent Application Number 13837348

13837348
Not Appealed
Patent NumberUS 08875070 B2
Publication NumberUS 20140096094 A1
Filled DateMar 15, 2013
Priority DateOct 3, 2012
Inventor/ApplicantsDavid Averill Bell
Bonnie E. Weir
ExaminesWHITMORE, STACY
Art Unit2851
Technology Center2800
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