Method and Apparatus for On-Chip Testing of High Speed Frequency Dividers | Patent Publication Number 20090322311
US 20090322311 A1Publication DateDec 31, 2009
Original AssigneeInternational Business Machines
Current AssigneeToshiba America Electronic Components
Inventor/ApplicantsMasaaki Kaneko
David William Boerstler
Jieming Qi
Eskinder Hailu
David William Boerstler
Jieming Qi
Eskinder Hailu
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