Method and Apparatus for On-Chip Testing of High Speed Frequency Dividers | Patent Application Number 12163166
12163166
Not Appealed
Inventor/ApplicantsDavid William Boerstler
Jieming Qi
Masaaki Kaneko
Eskinder Hailu
Jieming Qi
Masaaki Kaneko
Eskinder Hailu
ExaminesVALONE, THOMAS F
Art Unit2858
Technology Center2800
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