Extraction of imperfection features through spectral analysis | Patent Publication Number 20070219757

US 20070219757 A1
Patent NumberUS 07403871 B2
Application Number11743550
Filled DateMay 2, 2007
Priority DateNov 22, 2004
Publication DateSep 20, 2007
Original Assignee
Current AssigneeStylwan Ip Holding Llc
Inventor/ApplicantsWanda G. Papadimitriou
Stylianos Papadimitriou
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