Extraction of imperfection features through spectral analysis | Patent Number 07403871
US 07403871 B2Filled DateMay 2, 2007
Priority DateNov 22, 2004
Publication DateSep 20, 2007
Expiration DateNov 22, 2024
Inventor/ApplicantsStylianos Papadimitriou
Wanda G. Papadimitriou
Wanda G. Papadimitriou
ExaminesWACHSMAN, HAL D
Art Unit2857
Technology Center2800
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