Extraction of imperfection features through spectral analysis | Patent Publication Number 20060111872

US 20060111872 A1
Patent NumberUS 07231320 B2
Application Number11079745
Filled DateMar 14, 2005
Priority DateNov 22, 2004
Publication DateMay 25, 2006
Original Assignee
Current AssigneeStylwan Ip Holding Llc
Inventor/ApplicantsWanda G. Papadimitriou
Stylianos Papadimitriou
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