Extraction of imperfection features through spectral analysis | Patent Number 07231320

US 07231320 B2
Application Number11079745
Publication NumberUS 20060111872 A1
Pendency2 years, 3 months
Filled DateMar 14, 2005
Priority DateNov 22, 2004
Publication DateMay 25, 2006
Expiration DateNov 22, 2024
Inventor/ApplicantsWanda G. Papadimitriou
Stylianos Papadimitriou
ExaminesWACHSMAN, HAL D
Art Unit2857
Technology Center2800
Assignments
Stylwan Ip Holding Llc
Current
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