Microneedle array imaging device, microneedle array imaging method, microneedle array inspection device, and microneedle array inspection method | Patent Number 10922805

US 10922805 B2
Application Number16283841
Publication NumberUS 20190188844 A1
Pendency1 year, 11 months, 27 days
Filled DateFeb 25, 2019
Priority DateAug 17, 2017
Publication DateJun 20, 2019
Expiration DateAug 16, 2037
Inventor/ApplicantsTakashi MUROOKA
Kazuo Onishi
Kazuo ONISHI
Takashi Murooka
ExaminesCOUSO, YON JUNG
Art Unit2665
Technology Center2600
Assignments
Fujifilm
Current
FujifilmFujifilm Holdings Corporation
Original
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