Microneedle array imaging device, microneedle array imaging method, microneedle array inspection device, and microneedle array inspection method | Patent Application Number 16283841

16283841
Not Appealed
Patent NumberUS 10922805 B2
Publication NumberUS 20190188844 A1
Filled DateFeb 25, 2019
Priority DateAug 17, 2017
Inventor/ApplicantsTakashi MUROOKA
Kazuo Onishi
Kazuo ONISHI
Takashi Murooka
ExaminesCOUSO, YON JUNG
Art Unit2665
Technology Center2600
Assignments
Fujifilm
Current
FujifilmFujifilm Holdings Corporation
Original
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