Defect detection using test cases generated from test models | Patent Number 09703689

US 09703689 B2
Application Number14932138
Publication NumberUS 20170123962 A1
Pendency1 year, 8 months, 10 days
Filled DateNov 4, 2015
Priority DateNov 4, 2015
Publication DateMay 4, 2017
Expiration DateJul 11, 2021
Inventor/ApplicantsTomio Amano
Tomio AMANO
Rei Suginaka
Masaru YAMAMOTO
Natsumi KURASHIMA
Hirofumi MATSUZAWA
Natsumi Kurashima
Hirofumi Matsuzawa
Rei SUGINAKA
Masaru Yamamoto
ExaminesDAS, CHAMELI
Art Unit2197
Technology Center2100
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