Defect detection using test cases generated from test models | Patent Number 09703689
US 09703689 B2Filled DateNov 4, 2015
Priority DateNov 4, 2015
Publication DateMay 4, 2017
Expiration DateJul 11, 2021
Inventor/ApplicantsTomio Amano
Tomio AMANO
Rei Suginaka
Masaru YAMAMOTO
Natsumi KURASHIMA
Hirofumi MATSUZAWA
Natsumi Kurashima
Hirofumi Matsuzawa
Rei SUGINAKA
Masaru Yamamoto
Tomio AMANO
Rei Suginaka
Masaru YAMAMOTO
Natsumi KURASHIMA
Hirofumi MATSUZAWA
Natsumi Kurashima
Hirofumi Matsuzawa
Rei SUGINAKA
Masaru Yamamoto
ExaminesDAS, CHAMELI
Art Unit2197
Technology Center2100
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