Defect detection using test cases generated from test models | Patent Application Number 14932138
14932138
Not Appealed
Patent NumberUS 09703689 B2
Publication NumberUS 20170123962 A1
Filled DateNov 4, 2015
Priority DateNov 4, 2015
Inventor/ApplicantsTomio Amano
Tomio AMANO
Rei Suginaka
Masaru YAMAMOTO
Natsumi KURASHIMA
Hirofumi MATSUZAWA
Natsumi Kurashima
Hirofumi Matsuzawa
Rei SUGINAKA
Masaru Yamamoto
Tomio AMANO
Rei Suginaka
Masaru YAMAMOTO
Natsumi KURASHIMA
Hirofumi MATSUZAWA
Natsumi Kurashima
Hirofumi Matsuzawa
Rei SUGINAKA
Masaru Yamamoto
ExaminesDAS, CHAMELI
Art Unit2197
Technology Center2100
Law Firm
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