Systems and methods for sub-zero threshold characterization in a memory cell | Patent Publication Number 20150117097

US 20150117097 A1
Patent NumberUS 09378840 B2
Application Number14085553
Filled DateNov 20, 2013
Priority DateOct 28, 2013
Publication DateApr 30, 2015
Inventor/ApplicantsYu Cai
Erich F. Haratsch
Yunxiang Wu
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