INTEGRATED CIRCUIT COMPRISING TEST CIRCUITRY FOR TESTING FAN-OUT PATHS OF A TEST CONTROL PRIMARY INPUT | Patent Publication Number 20140365838

US 20140365838 A1

Patent Number-

Application Number13914753

Filled DateJun 11, 2013

Priority DateJun 11, 2013

Publication DateDec 11, 2014

Original Assignee

Current AssigneeLsi Broadcom
Agere Systems Broadcom

Inventor/ApplicantsVijay Sharma
Ramesh C. Tekumalla

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