Defect detecting method based on dimensionality reduction of data, electronic device, and storage medium | Patent Number 12112522

US 12112522 B2
Application Number17587086
Publication NumberUS 20220254148 A1
Pendency2 years, 8 months, 14 days
Filled DateJan 28, 2022
Priority DateJan 28, 2022
Publication DateAug 11, 2022
Expiration DateJan 27, 2042
Inventor/ApplicantsTZU-CHEN LIN
Tzu-Chen Lin
CHIN-PIN KUO
TUNG-TSO TSAI
Chin-Pin Kuo
Tung-Tso Tsai
ExaminesYENTRAPATI, AVINASH
Art Unit2672
Technology Center2600
Assignments
Foxconn Technology Group
Current
Foxconn Technology Group
Original
Law Firm
You must be logged in to view
Login
Attorneys
Subscription-Only
View Concierge Program
See the invalidated claims, subscribe to our Concierge Program.
View Concierge Program
Patent Prosecution report image

Empower your practice with Patexia Publication Prosecution IP Module.

Get access to our exclusive rankings and unlock powerful data.
Check our Latest ReportPurchase IP Module

Looking for a Publication Attorney?

Get in touch with our team or create your account to start exploring a network of over 120K attorneys.