Spurious-response interference tester | Patent Number 06813477
US 06813477 B1Filled DateFeb 20, 2001
Priority DateJan 23, 2001
Publication Date-
Expiration DateNov 2, 2008
Inventor/ApplicantsRandall L. Grunwell
Eldridge E. Harris
Pieter C. Seidel
Eldridge E. Harris
Pieter C. Seidel
ExaminesTRAN, TUAN A
Art Unit2682
Technology Center2600
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