Methods for the detection of chromosomal aberrations | Patent Number 06214558
US 06214558 NAFilled DateJul 27, 2000
Priority DateAug 14, 1996
Publication Date-
Expiration DateAug 14, 2016
Inventor/Applicants Anthony P. Shuber
Stanley N. Lapidus
Stanley N. Lapidus
ExaminesHOUTTEMAN, SCOTT W
Art Unit1656
Technology Center1600
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