Intron sequence analysis method for detection of adjacent and remote locus alleles as haplotypes | Patent Number 05612179
US 05612179 NAFilled DateSep 23, 1992
Priority DateAug 25, 1989
Publication Date-
Expiration DateAug 25, 2009
Inventor/Applicants Malcolm J. Simons
ExaminesSISSON, BRADLEY L
Art Unit1807
Technology Center1800
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