System, method and apparatus for macroscopic inspection of reflective specimens | Patent Application Number 18175216

18175216
Not Appealed
Patent NumberUS 11961210 B2
Publication NumberUS 20230206405 A1
Filled DateFeb 27, 2023
Priority DateAug 7, 2019
Inventor/ApplicantsMatthew C. Putman
Jonathan Lee
John B. Putman
Damas Limoge
Michael Moskie
ExaminesWONG, ALLEN C
Art Unit2488
Technology Center2400
Assignments
Orbimed Royalty Opportunities Ii L.p
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Nanotronics Imaging
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