Method of characterizing errors in NAND flash memory, and error estimation method and storage system control method using the same | Patent Application Number 18093432

18093432
Not Appealed
Patent NumberUS 12158808 B2
Publication NumberUS 20230297471 A1
Filled DateJan 5, 2023
Priority DateMar 16, 2022
Inventor/ApplicantsJi Yoon JUNG
Ha Young LIM
Ji Yoon Jung
Sung Gil Hong
Sung Gil HONG
Ha Young Lim
Do Hee Kim
Do Hee KIM
Examines-
Art Unit0
Technology Center0
Assignments
Fadu Inc.
Current
Fadu Inc.
Original
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