Method of searching read voltage of nonvolatile memory device using regression analysis and method of reading data from nonvolatile memory device using the same | Patent Application Number 17804851

17804851
Not Appealed
Patent NumberUS 11961553 B2
Publication NumberUS 20230119534 A1
Filled DateMay 31, 2022
Priority DateMay 31, 2022
Inventor/ApplicantsWijik Lee
Kwanwoo Noh
Hyeonjong Song
WIJIK LEE
KWANWOO NOH
HYEONJONG SONG
ExaminesDINH, SON T
Art Unit2824
Technology Center2800
Assignments
Samsung Electronics
Current
Samsung Electronics
Original
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