High-frequency component test device and method thereof | Patent Application Number 17559371

17559371
Not Appealed
Patent NumberUS 12163989 B2
Publication NumberUS 20220341978 A1
Filled DateDec 22, 2021
Priority DateApr 26, 2021
Inventor/ApplicantsJie ZHANG
Sih-Han Li
Peng-I MEI
Sih-Han LI
Jie Zhang
Peng-I Mei
ExaminesFAKHRUDDIN, ASM NMN
Art Unit2863
Technology Center2800
Assignments
Industrial Technology Research Institute
Current
Industrial Technology Research Institute
Original
Law Firm
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