Interferometric Detection and Quantification System and Methods of Use in Chemical Processing | Patent Application Number 17448082
17448082
Not Appealed
Inventor/ApplicantsRon LEVIN
Clinton BEELAND
James LeFILES
Joseph EGAN
Jacob THOMPSON
Timothy ZOLLERS
Clinton BEELAND
James LeFILES
Joseph EGAN
Jacob THOMPSON
Timothy ZOLLERS
ExaminesSODERQUIST, ARLEN
Art Unit1797
Technology Center1700
Assignments
Law Firm
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