Perpendicular magnetic recording medium | Patent Application Number 10141446
Shinzo Tsuboi
Shinzo Tsuboi
Katsumichi Tagami
Katsumichi Tagami
Hirotaka Hokkyo
The present invention provides a perpendicular magnetic recording medium 11 having a perpendicular magnetization film 22 formed on a substrate 20, wherein a high perpendicular orientation film 24 having higher perpendicular orientation than that of the perpendicular magnetization film 22 is formed over or/and under the perpendicular magnetization film 22.
- 1. A perpendicular magnetic recording medium consisting of:na perpendicular magnetization film formed on a substrate, wherein at least one high perpendicular orientation film having higher perpendicular magnetic anisotropic energy than the perpendicular magnetization film is formed over or/and under the perpendicular magnetization film;wherein the high perpendicular orientation film is made from a RCo5 alloy having a film thickness less than 50 nm, wherein R comprises a rare earth metal selected from the group consisting of Y, Ce, Sm, La and Pr, and said RCo5 alloy comprises a principal component of said film, andwherein the high perpendicular orientation film and the perpendicular orientation film are in direct contact with one another.
- 5. A perpendicular magnetic recording medium consisting of:na perpendicular magnetization film formed on a substrate, wherein a high perpendicular orientation film having higher perpendicular magnetic anisotropic energy than the perpendicular magnetization film is formed directly over or/and under the perpendicular magnetization film;wherein the high perpendicular orientation film is made from a RCo5 or a R2Co17 alloy having a film thickness less than 50 nm, wherein R comprises a rare earth metal selected from the group consisting of Y, Ce, Sm, La and Pr, and said RCo5 or R2Co17 alloy comprises a principal component of said film.
CROSS-REFERENCE TO RELATED APPLICATION
This application is a continuation of application Ser. No. 09/366,251, filed Aug. 3, 1999 now U.S. Pat. No. 6,426,157.
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a perpendicular magnetic recording medium used as a magnetic disc.
2. Description of the Related Art
Recently, with progress of personal computers and work stations, the hard disc has been required to have a large capacity and small size, i.e., a high density. However, in order to realize a high recording density in the conventional longitudinal direction recording method, there are various problems. For example, if the recording bit is made smaller, there arises a problem of thermal fluctuation of recording magnetization and a problem of high coercive force which may exceed the recording capability of the recording head. To cope with this, a perpendicular magnetic recording method has been studied as means to significantly increase the recording density.
FIG. 156
is a cross sectional view of such a conventional magnetic recording medium. In this perpendicular magnetic recording medium 50, a perpendicular magnetization film 54 having a perpendicular magnetic anisotropy is formed on a substrate 56. For example, CoCr alloys are used for the perpendicular magnetization film (Journal of Magn. Soc. Japan, Vol. 8, No. 1, 1984, pp. 17–22).However, in such a conventional perpendicular magnetic recording medium, there has been a problem that medium noise characteristic is very bad in a low recording density region. This is because the perpendicular magnetization film 54 is magnetized perpendicularly, and a demagnetizing field caused by the magnetic poles generated on the medium surface generates a reversed-magnetic domain. The lower is the recording density, the more the reversed-magnetic domains are generated. This has been the main cause to deteriorate the medium noise characteristic in the low recording density region. This medium noise increase in the low recording density region becomes a big trouble when forming a high-density information recording apparatus.
In order to reduce the effect of the demagnetizing field generated by the magnetic pole generated on the medium surface, there has been suggested to provide a soft magnetic layer under the perpendicular magnetization film so as to reduce the magnetic poles generated at the boundary between the perpendicular magnetization film and the soft magnetic layer (Japanese Patent Publication (examined) B58-91). This is generally known as a perpendicular two-layered magnetic recording medium.
However, in this two-layered perpendicular magnetic recording medium, if a perpendicular magnetization film is provided on a soft magnetic layer such as NiFe (Permalloy), there arises a problem that the soft magnetic layer generates a spike-shaped noise, disabling to obtain a preferable medium S/N ratio.
To cope with this, Japanese Patent Publication (unexamined) A59-127235, Japanese Patent Publication (unexamined) A59-191130, Japanese Patent Publication (unexamined) A60-239916, Japanese Patent Publication (unexamined) A61-8719, and Japanese Patent Publication (unexamined) A1-173312 suggest use of a perpendicular magnetization film on a backing layer made from Co or a Co alloy which is more advantageous than use of the permalloy soft magnetic layer.
However, the inventor of the present invention has found that when these soft magnetic films are used, these films easily absorb an external magnetic field generated by a magnetic disc rotation spindle motor. This results in concentration of the magnetic flux in a magnetic head and losing of recording signals. That is, the perpendicular magnetic recording medium of the two-layered film configuration can reduce the effect of the demagnetizing field caused by the magnetic poles generated on the medium surface, but this cannot be a solution for medium noise reduction.
SUMMARY OF THE INVENTION
It is therefore an object of the present invention to provide a perpendicular magnetic recording medium having a reduced effect of the demagnetizing field caused by a magnetic poles generated on a perpendicular magnetization film surface and having a preferable medium noise characteristic in a low recording density region.
The perpendicular magnetic recording medium according to the present invention has a perpendicular magnetization film formed on a substrate, wherein a high perpendicular orientation film having higher perpendicular orientation than the perpendicular magnetization film is formed over or/and under the perpendicular magnetization film.
A backing soft magnetic film may be formed under the high perpendicular orientation film, or under the perpendicular magnetic film if there is no high perpendicular orientation film under the perpendicular magnetization film.
It is preferable that the high perpendicular orientation film have a perpendicular magnetic anisotropic energy Ku [erg/cc] and a saturation magnetization Ms [emu/cc] which are in the relationship R defined as 2 Ku/4πMs2 equal to or greater than (≧) 1.4.
Moreover, it is preferable that the high perpendicular orientation film have a greater perpendicular magnetic anisotropic energy than that of the perpendicular magnetization film. The perpendicular magnetic anisotropic energy of the high perpendicular orientation film is preferably equal to or greater than 1×106 [erg/cc], and more preferably equal to or greater than 2×107 [erg/cc]. The high perpendicular orientation film preferably has a thickness equal to or greater than 50 [nm]
The high perpendicular orientation film is preferably made from: a CoCrM alloy (wherein M represent three elements selected from a group consisting of Pt, Ta, La, Lu, Pr, and Sr); an alloy containing RCo5 (R=Y, Ce, Sm, La, Pr) as a main content; an alloy containing R2Co17 (R=Y, Ce, Sm, La, Pr) as a main content; Ba ferrite (BaFe12O19 BaFe18O27 and the like); Sr ferrite (SrFe12O19, SrFe18O27 and the like), PtCo, and the like.
The backing soft magnetic film is preferably made from FeSiAl, FesiAl alloy, FeTaN, FeTaN alloy, and the like.
In the perpendicular magnetic recording medium according to the present invention, the perpendicular magnetization film on its upper surface or lower surface a high perpendicular orientation film having a higher perpendicular orientation than that of the perpendicular magnetization film. Accordingly, it is possible to significantly suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.
When the high perpendicular orientation film is made from a CoCr alloy, it is preferable that the perpendicular magnetic anisotropic energy Ku [erg/cc] and the saturation magnetization Ms [emu/cc] be in the relationship as R=2 Ku/4πMs2 wherein R≧1.4.
On the other hand, when the high perpendicular orientation film is made from a SmCo alloy (i.e., a material other than the CoCr alloy), it is preferable that the high perpendicular orientation film have a perpendicular magnetic anisotropic energy Ku greater than that of the perpendicular magnetization film. This enables to reduce generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1
is a cross sectional view of a perpendicular magnetic recording medium according to a first embodiment of the present invention.FIG. 2
is a cross sectional view of a perpendicular magnetic recording medium according to a second embodiment of the present invention.FIG. 3
is a cross sectional view of a perpendicular magnetic recording medium according to a third embodiment of the present invention.FIG. 4
is a cross sectional view of a perpendicular magnetic recording medium according to a fourth embodiment of the present invention.FIG. 5
is a cross sectional view of a perpendicular magnetic recording medium according to a fifth embodiment of the present invention.FIG. 6
is a cross sectional view of a perpendicular magnetic recording medium according to a sixth embodiment of the present invention.FIG. 7
is a table showing values of perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms for each of the Examples of the present invention.FIG. 8
is a graph showing medium noise dependency on the recording density in Example 1 of the present invention.FIG. 9
is a table showing relationships between the film thickness and the medium noise in Example 1 of the present invention.FIG. 10
is another table showing relationships between the film thickness and the medium noise in the Example 1 of the present invention.FIG. 11
is still another table showing relationship between the film thickness and the medium noise in the Example 1 of the present invention.FIG. 12
is yet another table showing relationships between the film thickness and the medium noise in the Example 1 of the present invention.FIG. 13
is still yet another table showing relationships between the film thickness and the medium noise in the Example 1 of the present invention.FIG. 14
is a table showing values of the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms for the respective Examples of the present invention.FIG. 15
is a graph showing the medium noise dependency on the recording density in Example 2 of the present invention.FIG. 16
is another table showing the relationship between the film thickness and the medium noise in Example 2 of the present invention.FIG. 17
is still another table showing the relationship between the film thickness and the medium noise in Example 2 of the present invention.FIG. 18
is yet another table showing the relationship between the film thickness and the medium noise in Example 2 of the present invention.FIG. 19
is still yet another table showing the relationship between the film thickness and the medium noise in Example 2 of the present invention.FIG. 20
is yet another table showing the relationship between the film thickness and the medium noise in Example 2 of the present invention.FIG. 21
is a table showing values of the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms for the respective Examples of the present invention.FIG. 22
is a graph showing the medium noise dependency on the recording density in Example 3 of the present invention.FIG. 23
is a table showing the relationship between the film thickness and the medium noise in Example 3 of the present invention.FIG. 24
is another table showing the relationship between the film thickness and the medium noise in Example 3 of the present invention.FIG. 25
is still another table showing the relationship between the film thickness and the medium noise in Example 3 of the present invention.FIG. 26
is yet another table showing the relationship between the film thickness and the medium noise in Example 3 of the present invention.FIG. 27
is still yet another table showing the relationship between the film thickness and the medium noise in Example 3 of the present invention.FIG. 28
is a table showing values of the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms for the respective Examples of the present invention.FIG. 29
is a graph showing the medium noise dependency on the recording density in Example 4-1 of the present invention.FIG. 30
is a table showing the relationship between the film thickness and the medium noise in Example 4-1 of the present invention.FIG. 31
is another table showing the relationship between the film thickness and the medium noise in Example 4-1 of the present invention.FIG. 32
is still another table showing the relationship between the film thickness and the medium noise in Example 4-1 of the present invention.FIG. 33
is yet another table showing the relationship between the film thickness and the medium noise in Example 4-1 of the present invention.FIG. 34
is still yet another table showing the relationship between the film thickness and the medium noise in Example 4-1 of the present invention.FIG. 35
is a table showing values of the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms for the respective Examples of the present invention.FIG. 36
is a graph showing the medium noise dependency on the recording density in Example 4-2 of the present invention.FIG. 37
is a table showing the relationship between the film thickness and the medium noise in Example 4-2 of the present invention.FIG. 38
is another table showing the relationship between the film thickness and the medium noise in Example 4-2 of the present invention.FIG. 39
is still another table showing the relationship between the film thickness and the medium noise in Example 4-2 of the present invention.FIG. 40
is yet another table showing the relationship between the film thickness and the medium noise in Example 4-2 of the present invention.FIG. 41
is still yet another table showing the relationship between the film thickness and the medium noise in Example 4-2 of the present invention.FIG. 42
is a graph showing the medium noise dependency on the recording density in Example 5 of the present invention.FIG. 43
is a table showing the relationship between the film thickness and the medium noise in Example 5 of the present invention.FIG. 44
is a table showing the relationship between the film thickness and the medium noise in Example 5 of the present invention.FIG. 45
is another table showing the relationship between the film thickness and the medium noise in Example 5 of the present invention.FIG. 46
is still another table showing the relationship between the film thickness and the medium noise in Example 5 of the present invention.FIG. 47
is yet another table showing the relationship between the film thickness and the medium noise in Example 5 of the present invention.FIG. 48
is a graph showing the medium noise dependency on the recording density in Example 6 of the present invention.FIG. 49
is a table showing the relationship between the film thickness and the medium noise in Example 6 of the present invention.FIG. 50
is another table showing the relationship between the film thickness and the medium noise in Example 6 of the present invention.FIG. 51
is still another table showing the relationship between the film thickness and the medium noise in Example 6 of the present invention.FIG. 52
is yet another table showing the relationship between the film thickness and the medium noise in Example 6 of the present invention.FIG. 53
is still yet another table showing the relationship between the film thickness and the medium noise in Example 6 of the present invention.FIG. 54
is a graph showing the medium noise dependency on the recording density in Example 7 of the present invention.FIG. 55
is a table showing the relationship between the film thickness and the medium noise in Example 7 of the present invention.FIG. 56
another table showing the relationship between the film thickness and the medium noise in Example 7 of the present invention.FIG. 57
is still another table showing the relationship between the film thickness and the medium noise in Example 7 of the present invention.FIG. 58
is yet another table showing the relationship between the film thickness and the medium noise in Example 7 of the present invention.FIG. 59
is yet still another table showing the relationship between the film thickness and the medium noise in Example 7 of the present invention.FIG. 60
is a graph showing the medium noise dependency on the recording density in Example 8-1 of the present invention.FIG. 61
is a table showing the relationship between the film thickness and the medium noise in Example 8-1 of the present inventionFIG. 62
is another table showing the relationship between the film thickness and the medium noise in Example 8-1 of the present invention.FIG. 63
is yet another table showing the relationship between the film thickness and the medium noise in Example 8-1 of the present invention.FIG. 64
is still another table showing the relationship between the film thickness and the medium noise in Example 8-1 of the present invention.FIG. 65
is yet still another table showing the relationship between the film thickness and the medium noise in Example 8-1 of the present invention.FIG. 66
is a graph showing the medium noise dependency on the recording density in Example 8-2 of the present invention.FIG. 67
is a table showing the relationship between the film thickness and the medium noise in Example 8-2 of the present invention.FIG. 68
is another table showing the relationship between the film thickness and the medium noise in Example 8-2 of the present invention.FIG. 69
is yet another table showing the relationship between the film thickness and the medium noise in Example 8-2 of the present invention.FIG. 70
is still another table showing the relationship between the film thickness and the medium noise in Example 8-2 of the present invention.FIG. 71
is yet still another table showing the relationship between the film thickness and the medium noise in Example 8-2 of the present invention.FIG. 72
is a graph showing the medium noise dependency on the recording density in Example 9 of the present invention.FIG. 73
is a table showing the relationship between the film thickness and the medium noise in Example 9 of the present invention.FIG. 74
is another table showing the relationship between the film thickness and the medium noise in Example 9 of the present invention.FIG. 75
is yet another table showing the relationship between the film thickness and the medium noise in Example 9 of the present invention.FIG. 76
is still another table showing the relationship between the film thickness and the medium noise in Example 9 of the present invention.FIG. 77
is yet still another table showing the relationship between the film thickness and the medium noise in Example 9 of the present invention.FIG. 78
is a graph showing the medium noise dependency on the recording density in Example 10-1 of the present invention.FIG. 79
is a table showing the relationship between the-film thickness and the medium noise in Example 10-1 of the present invention.FIG. 80
is another table showing the relationship between the film thickness and the medium noise in Example 10-1 of the present invention.FIG. 81
is yet another table showing the relationship between the film thickness and the medium noise in Example 10-1 of the present invention.FIG. 82
is still another table showing the relationship between the film thickness and the medium noise in Example 10-1 of the present invention.FIG. 83
is yet still another table showing the relationship between the film thickness and the medium noise in Example 10-1 of the present invention.FIG. 84
is a graph showing the medium noise dependency on the recording density in Example 10-2 of the present invention.FIG. 85
is a table showing the relationship between the film thickness and the medium noise in Example 10-2 of the present invention.FIG. 86
is another table showing the relationship between the film thickness and the medium noise in Example 10-2 of the present invention.FIG. 87
is yet another table showing the relationship between the film thickness and the medium noise in Example 10-2 of the present invention.FIG. 88
is still another table showing the relationship between the film thickness and the medium noise in Example 10-2 of the present invention.FIG. 89
is yet still another table showing the relationship between the film thickness and the medium noise in Example 10-2 of the present invention.FIG. 90
is a table showing values of the perpendicular magnetic anisotropic energy Ku of the respective Examples of the present invention.FIG. 91
is a graph showing the medium noise dependency on the recording density in Example 11 of the present invention.FIG. 92
is a table showing the relationship between the film thickness and the medium noise in Example 11 of the present invention.FIG. 93
is a graph showing the medium noise dependency on the recording density in Example 12 of the present invention.FIG. 94
is a table showing the relationship between the film thickness and the medium noise in Example 12 of the present invention.FIG. 95
is a graph showing the medium noise dependency on the recording density in Example 13 of the present invention.FIG. 96
is a table showing the relationship between the film thickness and the medium noise in Example 13 of the present invention.FIG. 97
is a graph showing the medium noise dependency on the recording density in Example 14 of the present invention.FIG. 98
is a table showing the relationship between the film thickness and the medium noise in Example 14 of the present invention.FIG. 99
is a graph showing the medium noise dependency on the recording density in Example 15 of the present invention.FIG. 100
is a table showing the relationship between the film thickness and the medium noise in Example 15 of the present invention.FIG. 101
is a graph showing the medium noise dependency on the recording density in Example 16 of the present invention.FIG. 102
is a table showing the relationship between the film thickness and the medium noise in Example 16 of the present invention.FIG. 103
is a graph showing the medium noise dependency on the recording density in Example 17 of the present invention.FIG. 104
is a table showing the relationship between the film thickness and the medium noise in Example 17 of the present invention.FIG. 105
is a graph showing the medium noise dependency on the recording density in Example 18 of the present invention.FIG. 106
is a table showing the relationship between the film thickness and the medium noise in Example 18 of the present invention.FIG. 107
is a graph showing the medium noise dependency on the recording density in Example 19 of the present invention.FIG. 108
is a table showing the relationship between the film thickness and the medium noise in Example 19 of the present invention.FIG. 109
is a graph showing the medium noise dependency on the recording density in Example 20 of the present invention.FIG. 110
is a table showing the relationship between the film thickness and the medium noise in Example 20 of the present invention.FIG. 111
is a table showing values of the perpendicular magnetic anisotropic energy Ku for the respective Examples of the present invention.FIG. 112
is a graph showing the medium noise dependency on the recording density in Example 21 of the present invention.FIG. 113
shows the relationship between the film thickness and the medium noise in Example 21 of the present invention.FIG. 114
is a graph showing the medium noise dependency on the recording density in Example 22 of the present invention.FIG. 115
shows the relationship between the film thickness and the medium noise in Example 22 of the present invention.FIG. 116
is a graph showing the medium noise dependency on the recording density in Example 23 of the present invention.FIG. 117
shows the relationship between the film thickness and the medium noise in Example 23 of the present invention.FIG. 118
is a graph showing the medium noise dependency on the recording density in Example 24 of the present invention.FIG. 119
shows the relationship between the film thickness and the medium noise in Example 24 of the present invention.FIG. 120
is a graph showing the medium noise dependency on the recording density in Example 25 of the present invention.FIG. 121
shows the relationship between the film thickness and the medium noise in Example 25 of the present invention.FIG. 122
is a graph showing the medium noise dependency on the recording density in Example 26 of the present invention.FIG. 123
shows the relationship between the film thickness and the medium noise in Example 26 of the present invention.FIG. 124
is a graph showing the medium noise dependency on the recording density in Example 27 of the present invention.FIG. 125
shows the relationship between the film thickness and the medium noise in Example 27 of the present invention.FIG. 126
is a graph showing the medium noise dependency on the recording density in Example 28 of the present invention.FIG. 127
shows the relationship between the film thickness and the medium noise in Example 28 of the present invention.FIG. 128
is a graph showing the medium noise dependency on the recording density in Example 29 of the present invention.FIG. 129
shows the relationship between the film thickness and the medium noise in Example 29 of the present invention.FIG. 130
is a graph showing the medium noise dependency on the recording density in Example 30 of the present invention.FIG. 131
shows the relationship between the film thickness and the medium noise in Example 30 of the present invention.FIG. 132
is a graph showing the medium noise dependency on the recording density in Example 31 of the present invention.FIG. 133
shows the relationship between the film thickness and the medium noise in Example 31 of the present invention.FIG. 134
is a graph showing the medium noise dependency on the recording density in Example 32 of the present invention.FIG. 135
shows the relationship between the film thickness and the medium noise in Example 32 of the present invention.FIG. 136
is a graph showing the medium noise dependency on the recording density in Example 33 of the present invention.FIG. 137
shows the relationship between the film thickness and the medium noise in Example 33 of the present invention.FIG. 138
is a graph showing the medium noise dependency on the recording density in Example 34 of the present invention.FIG. 139
shows the relationship between the film thickness and the medium noise in Example 34 of the present invention.FIG. 140
is a graph showing the medium noise dependency on the recording density in Example 35 of the present invention.FIG. 141
shows the relationship between the film thickness and the medium noise in Example 35 of the present invention.FIG. 142
is a graph showing the medium noise dependency on the recording density in Example 36 of the present invention.FIG. 143
shows the relationship between the film thickness and the medium noise in Example 36 of the present invention.FIG. 144
is a graph showing the medium noise dependency on the recording density in Example 37 of the present invention.FIG. 145
shows the relationship between the film thickness and the medium noise in Example 37 of the present invention.FIG. 146
is a graph showing the medium noise dependency on the recording density in Example 38 of the present invention.FIG. 147
shows the relationship between the film thickness and the medium noise in Example 38 of the present invention.FIG. 148
is a graph showing the medium noise dependency on the recording density in Example 39 of the present invention.FIG. 149
shows the relationship between the film thickness and the medium noise in Example 39 of the present invention.FIG. 150
is a graph showing the medium noise dependency on the recording density in Example 40 of the present invention.FIG. 151
shows the relationship between the film thickness and the medium noise in Example 40 of the present invention.FIG. 152
is a graph showing the medium noise dependency on the recording density in Example 41 of the present invention.FIG. 153
shows the relationship between the film thickness and the medium noise in Example 41 of the present invention.FIG. 154
is a graph showing the medium noise dependency on the recording density in Example 42 of the present invention.FIG. 155
shows the relationship between the film thickness and the medium noise in Example 42 of the present invention.FIG. 156
is a cross sectional view of a conventional perpendicular magnetic recording medium.DESCRIPTION OF THE PREFERRED EMBODIMENTS
FIG. 1
toFIG. 6
are cross sectional views of perpendicular magnetic recording media according to the present invention.FIG. 1
shows a perpendicular magnetic recording medium 11 including a perpendicular magnetization film 22 and a high perpendicular orientation film 24 formed in this order on a substrate 20.FIG. 2
shows a perpendicular magnetic recording medium 12 including a high perpendicular orientation film 24 and a perpendicular magnetization film formed in this order on a substrate 20.FIG. 3
shows a perpendicular magnetic recording medium 13 including a high perpendicular orientation film 24, a perpendicular magnetization film 22, and a high perpendicular orientation film 24 formed in this order on a substrate 20.FIG. 4
shows a perpendicular magnetic recording medium 14 including a backing soft magnetic film 26, a perpendicular magnetization film 22, and a high perpendicular orientation film 24 formed in this order on a substrate 20.FIG. 5
shows a perpendicular magnetic recording medium 15 including a backing soft magnetic film 26, a high perpendicular orientation film 24, and a perpendicular magnetization film 22 formed in this order on a substrate 20.FIG. 6
shows a perpendicular magnetic recording medium 15 including a backing soft magnetic film 26, a high perpendicular orientation film 24, a perpendicular magnetization film 22, and a high perpendicular orientation film 24 formed in this order on a substrate 20.The high perpendicular orientation film 24 has a higher perpendicular orientation characteristic than the perpendicular magnetization film 22. The high perpendicular orientation film 24 may be made from: CoCrM alloys wherein M represents any three elements selected from a group consisting of Pt, Ta, La, Lu, Pr, and Sr; RCo5 wherein R represents any one of Y, Ce, Sm, La, and Pr; R2Co17 wherein R represents any one of Y, Ce, Sm, La, and Pr; Ba ferrite, Sr ferrite, PtCo, and the like.
The high perpendicular orientation film 24 made from the aforementioned materials is provided at least over or under the perpendicular magnetization film 22. This reduces effects of the demagnetizing field generated by the magnetic pole on the surface of the perpendicular magnetization film 22. Accordingly, it is possible to obtain a perpendicular magnetic recording medium having a preferable noise characteristic even in the low recording density region.
EXAMPLE 1
Using a 6-inch Co80Cr17Ta3 (%) target for sputtering, a perpendicular magnetization film Co80Cr17Ta3 was formed to have a thickness of 100 nm on a 2.5-inch substrate at 400 degrees centigrade. The film formation conditions were as follows: initial vacuum degree 5×10−7 [mTorr]; electric power 0.5 [kw]; argon gas pressure 4 [mTorr]; film formation speed 3 [nm/sec].
After this, the film was covered by the high perpendicular orientation film of 5 to 55 [nm] thickness formed by using: a Co74Cr22Pt2TaLa target, a Co75Cr21Pt2TaLa target, a Co76Cr20Pt2TaLa target, a Co77Cr19Pt2TaLa target, and a Co78Cr18Pt2TaLa target.
After this, a C (carbon) protection film 10 [nm] was formed to cover the high perpendicular orientation film.
The medium having the high perpendicular orientation film of Co76Cr20Pt2TaLa of 50 [nm] thickness will be referred to as medium AAA2 of the present invention. On the other hand, the medium having only the perpendicular magnetization film Co80Cr17Ta3without forming the high perpendicular orientation film of Co76Cr20Pt2TaLa will be referred to as a conventional medium (comparative example) D1.
It should be noted we also prepared a medium having the Co76Cr20Pt2TaLa film and the Co80Cr17Ta3 film in the reversed order. That is, firstly, Co75Cr20Pt2TaLa film was formed on the substrate, and then the Co80Cr17Ta3 film was formed on the Co76Cr20Pt2TaLa film.
The perpendicular magnetic anisotropic energy Ku of the following seven films were measured using a torque magnetometer; and saturation magnetization Ms of the seven films were measured using a sample vibration type magnetometer (VSM): a Co74Cr22Pt2TaLa film, a Co75Cr21Pt2TaLa film, a Co76Cr20Pt2TaLa film, a Co77Cr19Pt2TaLa film, a Co78Cr18Pt2TaLa film, a Co78Cr19Ta3 film, and a Co80Cr17Ta3 film. The measurement results are shown in
FIG. 7
.In general, a magnetic film can be a perpendicular magnetization film if the perpendicular anisotropy magnetic field Hk is greater than the maximum perpendicular magnetic field 4 pMs (p represents the number π) so as to satisfy the relationship of Hk≧4 pMs. Moreover, the perpendicular anisotropy magnetic field Hk can be expressed by using the perpendicular magnetic anisotropic energy Ku, i.e., Hk=2 Ku/Ms. That is, the quality of the perpendicular orientation of the perpendicular magnetization film can be determined by finding which is greater Hk or 4 pMs. Here, R is assumed to be Hk/4 pMs, and the R values are shown in the table of
FIG. 7
.The Co80Cr17Ta3 film-has R=1.1 whereas the Co76Cr20Pt2TaLa film has R=1.4. That is the Co76Cr20Pt2TaLa film has by far better perpendicular magnetic anisotropy than the Co80Cr17Ta3 film. However, if the percentage content of the Co is 73% or below, the Co alloy does not show the ferromagnetic characteristic. Accordingly, it is impossible to lower the Co content without limit.
On the other hand, by using the ID (inductive)/MR(magneto-resistance effect) composite head, the recording/reproduction characteristics were checked on the medium AAA2 of the present invention and the conventional medium D1. The check conditions were set as follows: ID/MR composite head recording track width 4 [micrometers], the reproduction track width 3 [micrometers], recording gap length 0.4 [micrometers], and reproduction gap length 0.32 [micrometers]. Evaluation of the check was performed under the conditions of: recording current 19 [mAop], sense current 12 [mA], peripheral velocity 12.7 [m/s], floating amount 45 [nm], and noise bandwidth 50 [MHz].
FIG. 8
shows the medium noise dependency on the recording density for the AAA2 of the present invention and the conventional D1. As is clear fromFIG. 8
, the conventional medium D1 shows a very high medium noise in the lower recording density, whereas in the medium AAA2 of the present invention, the medium noise in the same recording region is much suppressed in comparison to the conventional medium D1. This is because the medium AAA2 of the present invention includes a film having a preferable perpendicular magnetic anisotropy on the perpendicular magnetization film of Co80Cr17Ta3. Accordingly, in contrast to the conventional D1, it is possible to much more suppress generation of reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in
FIG. 9
toFIG. 13
. As is clear fromFIG. 9
toFIG. 13
, when the value R (Hk/4 pMs) is smaller than 1.4, medium noise cannot be improved even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is impossible to sufficiently suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, if a film satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.As has been described above, the recording medium AAA2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the AAA2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co76Cr20Pt2TaLa film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co76Cr20Pt2TaLa film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.
EXAMPLE 2
Media of Example 2 were prepared in the same way as Example 1 except for that the CoxCr96−xPt2TaLa (74≦x≦78) target was replaced by CoxCr96−xPt2TaLu (74≦x≦78) target. The medium examples made from Co76Cr20Pt2TaLu film having a film thickness of 50 [nm] will be referred to as medium BBB2 of the present invention. Note that we also prepared media having the Co80Cr17Ta3 film and the Co76Cr20Pt2TaLu film in the reversed order, i.e., firstly Co76Cr20Pt2TaLu film was formed on the substrate, and then the Co80Cr17Ta3 film was formed thereon.
The perpendicular magnetic anisotropic energy Ku of the following six films were measured using a torque magnetometer; and saturation magnetization Ms of these six films were measured using a sample vibration type magnetometer (VSM): a Co74Cr22Pt2TaLu film, a Co75Cr21Pt2TaLu film, a Co76Cr20Pt2TaLu film, a Co77Cr19Pt2TaLu film, a Co78Cr18Pt2TaLu film, and a Co80Cr17Ta3 film. The check results are shown in
FIG. 14
andFIG. 7
.Here, R is defined as Hk/4 pMs in the same way as in Example 1.
FIG. 14
shows the R values for each of the films. The Co20Cr17Ta3 film has R=1.1 whereas the Co76Cr20Pt2TaLu film has R=1.4. That is, the Co76Cr20Pt2TaLu film shows by far more preferable perpendicular magnetic anisotropy than the Co80Cr17Ta3 film. However, the Co alloy film having Co content 73 or below does not show the ferromagnetic characteristic. Accordingly, it is impossible to reduce the Co content without limit.The ID/MR composite head was used to check the recording/reproduction characteristic of the medium BBB2 of the present invention and the conventional medium (comparative example) D1. The head and the recording/reproduction conditions were set in the same way as in Example 1.
FIG. 15
shows the medium noise dependency on the recording density for the BBB2 of the present invention and the conventional medium D1. As is clear fromFIG. 15
, the conventional medium D1 has a very high noise in the low recording medium region, whereas the medium BBB2 of the present invention shows noise by far lower than the conventional medium D1 in the low recording density region. This is because the BBB2 has a preferable film of perpendicular magnetic anisotropy on the perpendicular magnetization film of Co80Cr17Ta3 and it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film much more than the conventional medium D1.Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in
FIG. 16
toFIG. 20
. As is clear fromFIG. 16
toFIG. 20
, when the value R (Hk/4 pMs) is smaller than 1.4, medium noise cannot be improved even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is difficult to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, in the film which satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.As has been described above, the recording medium BBB2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the BBB2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co76Cr20Pt2TaLu film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co76Cr20Pt2TaLu film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.
EXAMPLE 3
Media of Example 3 were prepared in the same way as Example 1 except for that the CoxCr96−xPt2TaLa (74≦x≦78) target was replaced by CoxCr96−xPt2LaLu (74≦x≦78) target. The medium examples made from Co76Cr20Pt2LaLu film having a film thickness of 50 [nm] will be referred to as medium CCC2 of the present invention. Note that we also prepared media having the Co80Cr17Ta3 film and Co76Cr20Pt2LaLu film in the reversed order, i.e., firstly Co76Cr20Pt2LaLu film was formed on the substrate, and then the Co80Cr17Ta3 film was formed thereon.
The perpendicular magnetic anisotropic energy Ku of the following six films were measured using a torque magnetometer; and saturation magnetization Ms of these six films were measured using a sample vibration type magnetometer (VSM): a Co74Cr22Pt2LaLu film, a Co75Cr21Pt2LaLu film, a Co76Cr20Pt2LaLu film, a Co77Cr19Pt2LaLu film, a Co78Cr18Pt2LaLu film, and a Co80Cr17Ta3 film. The check results are shown in
FIG. 21
andFIG. 7
.Here, R is defined as Hk/4 pMs in the same way as in Example 1.
FIG. 21
shows the R values for each of the films. The Co80Cr17Ta3 film has R=1.1 whereas the Co76Cr20Pt2LaLu film has R=1.4. That is, the Co76Cr20Pt2LaLu film shows by far more preferable perpendicular magnetic anisotropy than the Co80Cr17Ta3 film. However, the Co alloy film having a Co percentage content of 73% or below does not show the ferromagnetic characteristic. Accordingly, it is impossible to reduce the Co content without limit.The ID/MR composite head was used to check the recording/reproduction characteristic of the medium CCC2 of the present invention and the conventional medium (comparative example) D1. The head and the recording/reproduction conditions were set in the same way as in Example 1.
FIG. 22
shows the medium noise dependency on the recording density for the CCC2 of the present invention and the conventional medium D1. As is clear fromFIG. 22
, the conventional medium D1 has a very high noise in the low recording medium region, whereas the medium CCC2 of the present invention shows noise by far lower than the conventional medium D1 in the low recording density region. This is because the CCC2 has a preferable film of perpendicular magnetic anisotropy on the perpendicular magnetization film of Co80Cr17Ta3 and it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film much more than the conventional medium D1.Next, the film thickness of the film formed on the perpendicular magnetization film was gradually changed from 5 to 55 [nm] to check the medium noise values at recording density 10 [KFRPI] for all the film types. The results of this check are shown in
FIG. 23
toFIG. 27
. As is clear fromFIG. 23
toFIG. 27
, when the value R (Hk/4 pMs) is smaller than 1.4, medium noise cannot be improved even if the film thickness is reduced. This is because if R is below 1.4, the perpendicular orientation characteristic is insufficient and it is difficult to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. On the other hand, if the film satisfies the relationship that R is equal to or greater than 1.4, i.e., R≧1.4, the medium noise is reduced up to the film thickness 50 [nm] for all the film types. As has been described above, in the film which satisfies the relationship that R is equal to or greater than 1.4, it is possible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film. However, even if the film satisfies the aforementioned relationship, the medium noise reduction cannot be seen when the film thickness exceeds 50 [nm]. This is because of the fact that if the film thickness is too great, the orientation perpendicular to the film surface is deteriorated and it is impossible to suppress generation of a reversed magnetic domain in the vicinity of the surface of the perpendicular magnetization film.As has been described above, the recording medium CCC2 of the present invention shows a preferable medium noise characteristic even in a low recording density region. That is, by using the CCC2 of the present invention, it is possible to realize suppression of medium noise increase in the low recording region. Moreover, when the Co76Cr20Pt2LaLu film is provided under or both under and over the perpendicular magnetization film, similar results can be obtained because of the aforementioned reasons. Furthermore, film types other than the Co76Cr20Pt2LaLu film can also have similar results if the relationship that R is equal to or more than 1.4 is satisfied.
EXAMPLE 4-1
Media of Example 4-1 were prepared in the same way as Example 1 except for that the CoxCr96−xPt2TaLa (74≦x≦78) target was replaced by CoxCr96−xTa2LaLu (74≦x≦78) target. The medium examples made from Co76Cr20Ta2LaLu film having a film thickness of 50 [nm] will be referred to as medium DDD2 of the present invention. Note that we also prepared media having the Co80Cr17Ta3 film and Co76Cr20Ta2LaLu film in the reversed order, i.e., firstly Co76Cr20Ta2LaLu film was formed on the substrate, and then the Co80Cr17Ta3 film was formed thereon.
FIG. 28
andFIG. 7
show the perpendicular magnetic anisotropic energy Ku and saturation magnetization Ms of the six films: a Co74Cr22Ta2LaLu film, a Co75Cr21Ta2LaLu film, a Co76Cr20Ta2LaLu film, a Co77Cr19Ta2LaLu film, a Co78Cr18Ta2LaLu film, and a Co80Cr17Ta3 film.Here, the R is defined in the same way as in Example 1.
FIG. 28
shows the respective R values. The Co80Cr17Ta3 film has R=1.1, wherea