100.

Inspection component 412 of control system 400 includes rollers for the curved track, a conveyor belt for the vertical track, or a robotic arm coupled to scanner 310. Inspection component 412 also may include a control arm 322. In some embodiments, inspection component 412 is stationary and IBR 100 is moved along a three-axis, a five-axis, and the like coordinate system.

Scanner 310 includes a coordinate measuring machine (CMM), a mechanical scanner, a laser scanner, a structured scanner, such as a white light scanner, a blue light scanner, and the like, a non-structured optical scanner, a non-visual scanner, and the like. For example, scanner 310 may be a blue light scanner. A “blue light scanner” may refer to a non-contact structure light scanner. The blue light scanner may have a scan range of between 100×75 mm²to 400×300 mm². An accuracy of the blue light scanner may be between 0.005 and 0.015 mm. The blue light scanner may determine distances between adjacent points in the point cloud of between 0.04 and 0.16 mm as measured across three axes. In some embodiments, a volume accuracy of the blue light scanner may be approximately 0.8 mm/m. A scan depth may be between approximately 400 and 450 nm. These parameters are illustrative only and may be outside these ranges. Use of a blue light scanner provides a high resolution point cloud for a three-dimensional object as digital map 450.

Inspection system 285 also may include a control arm 320. Control arm 320 may include a tool holder 321. Tool holder 321 is configured to couple to a subtractive component 323, such as a mill, a lathe, a cutter, and the like. Control arm 322 of inspection system 285 may be used for repair operations. Inspection system 285 may utilize control arm 320 along with control arm 322 for inspection and repair operations.

Controller 301 may be integrated into inspection system 285, using processor 286 and memory 287. Controller 301 may be configured as a central network element or hub to various systems and components of control system 400. Controller 301 includes processor 286, which is coupled to memory 287. Processor 286 executes instructions 454 stored in memory 287 to configure inspection system 285 and control system 400 to perform the functions disclosed herein. Controller 301 may be implemented as a single controller, such as through a single processor 286 and associated memory 287. Controller 301 also may be implemented as multiple processors, such as a main processor and local processors for various components. Controller 301 may be a general purpose processor, a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA), or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or any combination thereof. Controller 301 may include a processor configured to implement various logical operations in response to the execution of instructions 454.

Motor 404 of control system 400 is operably coupled to shaft 308 of inspection system 285. Motor 404 may comprise a direct current (DC) stepper, an alternating current (AC) motor, and the like. Sensor(s) 408 may include Hall effect sensor(s), optical sensor(s), resolver(s), and the like. Sensors 408 may include sensors configured to detect an angular position of shaft 308 during an inspection step for IBR 100. During inspection of IBR 100, controller 301 receives sensor data from sensors 408. Controller 301 may utilize the sensor data received from sensors 408 to correlate an angular position of IBR 100 being inspected with a location of scanner 310. In some embodiments, IBR 100 may remain stationary throughout an inspection process, such that control arm 320 or control arm 322 moves. Coordinates of the control arms may be determined via sensors 408 in a similar manner to orient and construct IBR 100 being inspected.

Sensor(s) 410 are configured to detect a position of scanner 310 during inspection processes. In this regard, sensors 410 may be position sensors, such as capacitive displacement sensors, eddy-current sensors, Hall effect sensors, inductive sensors, optical sensors, linear variable differential transformer (LVDT) sensors, photodiode array sensors, piezo-electric sensors, encoders, potentiometer sensors, ultrasonic sensors, and the like. During inspection of IBR 100, controller 301 is able to determine a location of scanner 310, an angular location of IBR 100 throughout the inspection. Based on the location of scanner 310, an angular location of IBR 100 and scanning data received from scanner 310, a digital map 450, or a robust point cloud, may be generated during the inspection of IBR 100. The point cloud encompasses the entire IBR, such as 95% to 100% of a surface area of IBR 100.

Analysis system 452 may be used for inspection, analysis, and repair processes for IBR 100. Analysis system includes processor 502, memory 504, and database 506. In some embodiments, analysis system 452 is a computer-based system. In other embodiments, analysis system 452 is a cloud-based computing system. Processor 502 is configured to receive digital map 450 from inspection system 285 via control system 400. Digital map 450 includes a point cloud or three-dimensional model of IBR 100.

Thus, defects 140 of IBR 100, as shown in FIG. 3, may be graphically depicted in finite element model 521. In some scenarios, finite element model 521 having defects 140 may cause issues with running structural or other simulations. The finite element model 521 is a modification of an original finite element model that reflects the specific damage or wear present on IBR 100.

FIG. 6 depicts a flowchart 600 for removing damage detected on a scan of an IBR 100 from an output file for a model according to the disclosed embodiments. Flowchart 600 may refer to FIGS. 1A-5 for illustrative purposes. Flowchart 600, however, is not limited to the embodiments disclosed by FIGS. 1A-5. The embodiments disclosed by flowchart 600 remove damage to a scanned blade, or airfoil, before being used in a finite element model analysis. The processes disclosed herein smooth regions of the model where damage exists. Such a model may be desired so that blend repairs may be analyzed on a blade or the IBR. In some embodiments, analysis system 452 may execute the processes disclosed by flowchart 600 to provide a revised finite element model 521 not having defects 140.

Step 602 executes by generating a digital map 450 of IBR 100 using inspection system 285. This process is disclosed above. Digital map 450 also may be referred to as scan data. A finite element model 521 may be provided from another source outside inspection system 285 and analysis system 452. Likewise, airfoil flowpath files 804 may be provided from another source outside inspection system 285