Methods, devices, and systems for improved quality inspection of products | Patent Publication Number 20190206045
US 20190206045 A1Publication DateJul 4, 2019
Original AssigneeMidea America Corp.
Current AssigneeMidea America Corp.
Inventor/ApplicantsDongyan WANG
Dongyan Wang
Tao LIU
Haisong Gu
Haisong GU
Tao Liu
Dongyan Wang
Tao LIU
Haisong Gu
Haisong GU
Tao Liu
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